Electromagnetic Characterization of Materials by using Transmission/Reflection (T/R) Devices

摘要

An overview of transmission/reflection-based methods for the electromagnetic characterisation of materials is presented. The paper initially describes the most popular approaches for the characterisation of bulk materials in terms of dielectric permittivity and magnetic permeability. Subsequently, the limitations and the methods aimed at removing the ambiguities deriving from the application of the classical Nicolson–Ross–Weir direct inversion are discussed. The second part of the paper is focused on the characterisation of partially conductive thin sheets in terms of surface impedance via waveguide setups. All the presented measurement techniques are applicable to conventional transmission reflection devices such as coaxial cables or waveguides.